Chalk & Wire Adds Enhanced Tagging to Assessment Platform
Chalk & Wire has released a new version of its assessment platform that includes a number of new features, most importantly an enhanced tagging option that will allow higher education institutions to perform more detailed analyses of student performance.
Chalk & Wire now allows administrators to create tags associated with specific student learning outcomes they are interested in tracking as well as certain submitted content they want to keep tabs on.
With its assessment platform, Chalk & Wire had already done a great deal to meld its e-portfolio and learning assessment functionalities. With the new tagging functionality, administrators will have a continuously updated visual report that can give them the ability to identify and analyze learning patterns quickly as they review student work and, at the same time, drill down into systems to look for very specific items.
"With tagging, organizations can easily generate another rich layer of assessment analysis across a large group of students," said Chalk & Wire CEO Geoff Irvine. "This increases the likelihood that patterns can be identified at a qualitative level."
Chalk & Wire also has an enhanced commenting tool that now offers smart-recall and the auto-entry of comments for an individual assessor or for multiple assessors across campus. The tool automatically creates a library of comments based on specific criteria or scoring levels that allows comments to be reused by a specific assessor or by others.
"After typing just a few words, assessors are shown full comments for selection and entry in one click," Irvine added. "This leverages feedback with specific correction for students that typically takes much longer to type."
Finally, the new version of the assessment platform allows for anonymous assessment of students in efforts to assure the validity and reliability of the assessment process itself.
About the Author
Michael Hart is a Los Angeles-based freelance writer and the former executive editor of THE Journal.